A Systems Approach

Consistently delivering quality parts on time requires a systems approach and because of our impeccable standards, we are a strategic supplier to leading defense, aerospace, semiconductor and instrumentation companies. The exceptional quality of our coatings and 99.5% success rate is a direct result of our dedication and commitment to our systems approach to quality that has been engrained in our culture for over 40 years; every employee takes it seriously.

IMG INTA LLC is AS9100D, ISO 9001:2015 certified and ITAR registered. Our knowledgeable and experienced quality experts perform incoming, in-process and final inspection along with first article inspection reports and COCs upon request. We do this across a diverse array of services that include plating, ceramic metallization, brazing and advanced turnkey solutions.

Inspection Practices

Quality is as only as good as its systems and inspection practices. We are steadfast in our relentless pursuit of upfront incoming materials inspection, in-process inspection and final inspection which is maintained through the utilization of optical microscopes for surface inspection as well as inspections for the verification of thickness, adhesion, peel strength and bake qualities. 

Primary Inspection Equipment

Equipment Model Manufacturer Description
XRF CMI 950 Oxford Measurement sytem for layer thickness analysis of metallic surfaces.
Optical Measurement System Starlite GX100 Ram Optical Magnification ranges from 34x to 176x, accurate, repeatable measurements.
CMM Microval Brown & Sharpe Measurement of geometric properties of parts and assemblies.
Image Dimension Measurement System IM 7020 Keyence Automatic data tracking and recording of results & key measurement identifiers, including calculation of critical measurements points and statistical values.
Microscope Digital VHX 950F Keyence Multi angle observation. Wide magnification range from 0.1x to 2000x. Quick depth composition & 3D display function.
AA Spectrometer AA240 Varian Analysis of plating solutions. Fast Sequential atomic absorption spectrometer able to handle multi-element suites with ease. Features automatic lamp selection, programmable gas box, and D2 background correction.
Equipment
XRF, CMI 950, Oxford
Optical Measurement System, Starlite GX100
CMM, Microval, Brown & Sharpe
Image Dimension Measurement, IM 7020
Microscope Digita, VHX 950Fl, Keyence
AA spectrometer, AA240, Varian